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Issue DateTitleAuthor(s)
23-Jun-2022Impact of temperature on reliability of MFIS HZO-based Ferroelectric tunnel junctionsSunbul, A.; Ali, T.; Hoffmann, R.; Revello, R.; Raffel, Y.; Duhan, P.; Lehninger, D.; Kuhnel, K.; Rudolph, M.; Oehler, S.; Schramm, P.; Czernohorsky, M.; Seidel, K.; Kampfe, T.; Eng, L.M.
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