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Browsing by Author Schramm, P.

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Issue DateTitleAuthor(s)
13-May-2024Endurance Study of Silicon-Doped Hafnium Oxide (HSO) and Zirconium-Doped Hafnium Oxide (HZO)-Based FeFET MemoryDuhan, P.; Ali, T.; Khedgarkar, P.; Kühnel, K; Czernohorsky, M.; Rudolph, M.; Hoffmann, R.; Sünbül, A.; Lehninger, D.; Schramm, P.; Kämpfe, T.; Seidel, K.
23-Jun-2022Impact of temperature on reliability of MFIS HZO-based Ferroelectric tunnel junctionsSunbul, A.; Ali, T.; Hoffmann, R.; Revello, R.; Raffel, Y.; Duhan, P.; Lehninger, D.; Kuhnel, K.; Rudolph, M.; Oehler, S.; Schramm, P.; Czernohorsky, M.; Seidel, K.; Kampfe, T.; Eng, L.M.
Showing results 1 to 2 of 2