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Title: | Activity induced in different rare earth materials using heavy ion oxygen beam; thin layer activation analysis |
Authors: | Savadi, V.V. Singh, D.P. Joshi, S.K. Majeed, I. Shuaib, Md. Sharma, V.R. Yadav, A. Kumar, R. Singh, P.P. Unnati Sharma, M.K. Pandey, S. Singh, B.P. Prasad, R. |
Keywords: | Activation technique Yield Cross section measurements Heavy ions Thin layer activation technique |
Issue Date: | 15-Dec-2020 |
Abstract: | Activities have been measured in spectroscopically pure rare earth materials viz; Terbium, Thulium and Tantalum, based on the remnant radioactivity induced in the material, when bombarded by 16O beam in the energy range from 70 MeV to 110 MeV. The cross sections of a number of isotopes populated through various reaction channels have been measured by the stacked foil activation technique. To measure the activity, yields of the radioactive isotopic products 172,171,170Ta, 171,170Hf, 171,170, 169Lu, 182,181Ir, 182,181Os, 181Re, 194,193,192Tl, 193, 192Hg, and 192,191,190Au have been determined using the measured cross-sections and subsequently used to measure the activity in these materials which has been found up to 8–16 μm. |
URI: | http://localhost:8080/xmlui/handle/123456789/1641 |
Appears in Collections: | Year-2020 |
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