Phase dependent radiation hardness and performance analysis of amorphous and polycrystalline Ga2O3 solar-blind photodetector against swift heavy ion irradiation

Abstract

Solar-blind photodetectors are critically important for civil and military applications. Several of these applications, such as space exploration and nuclear energy infrastructure, demand the use of a photodetector under extreme environments. In this paper, we have studied the radiation hardness and device performance of amorphous and polycrystalline gallium oxide thin films against heavy ion (Ag7+) irradiation with a high energy of 100 MeV. Gallium oxide thin films show great tenacity against massive and highly energetic ions. The amorphous and polycrystalline phases undergo structural and morphological changes that initially induce degradation in the device performance. Nano-pore like structures are formed in the amorphous film, while the polycrystalline film shows the destruction of large crystallites. The responsivity of the photodetector device reduces fourfold in the amorphous phase; however, a sixfold reduction in the performance is observed in the polycrystalline phase of the gallium oxide photodetector. The degradation is attributed to the annealing of pre-existing optical defects that are otherwise responsible for the huge photoconductive gain in the detector and confirmed by photoluminescence studies. The effect of self-annealing at room temperature and annealing at moderate temperature is investigated to recover the irradiated photodetector devices. Partial recovery in the polycrystalline based photodetector and two orders of magnitude enhanced responsivity and an almost twice faster response time compared to the control photodetectors in the amorphous phase are observed. This work investigates the effect of heavy and energetic ions on the performance of gallium oxide based solar-blind photodetector and provides the guideline to use high energy irradiation as a tool for defect engineering.