Please use this identifier to cite or link to this item: http://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/1871
Title: Estimating per-unit-length resistance parameter in emerging Copper-Graphene hybrid interconnects via prior knowledge based accelerated neural networks
Authors: Kumar, R.
Narayan, S. S. L.
Kumar, S.
Roy, S.
Kaushik, B. K.
Achar, R.
Sharma, R.
Keywords: Artificial neural networks (ANN)
coppergraphene hybrid interconnects
per-unit-length resistance
variability analysis
training data
Issue Date: 20-Jun-2021
Abstract: In this paper, an artificial neural network (ANN) is developed to model how the geometrical parameters of hybrid copper-graphene interconnects affect the per-unit-length resistance values. The proposed ANN is intelligently trained using large amounts of data representing the prior knowledge about the interconnects, extracted from an analytical model and sparse amount of data extracted from a rigorous full-wave electromagnetic solver. In this way, the training of the ANN model is accelerated without significant loss in accuracy.
URI: http://localhost:8080/xmlui/handle/123456789/1871
Appears in Collections:Year-2020

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