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DC Field | Value | Language |
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dc.contributor.author | Kumari, B. | - |
dc.contributor.author | Pandranki, S. | - |
dc.contributor.author | Sahoo, M. | - |
dc.contributor.author | Sharma, R. | - |
dc.date.accessioned | 2021-11-18T19:15:41Z | - |
dc.date.available | 2021-11-18T19:15:41Z | - |
dc.date.issued | 2021-11-19 | - |
dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/3212 | - |
dc.description.abstract | In this work, Cu-MWCNT composite is recommended as a potential solution to diminish breakdown in copper interconnects caused due to self- heating. CuMWCNT composite is less affected by temperature variation as compared to copper interconnect by 33%. To support this deduction, lateral temperature profiles of copper and CuMWCNT composite are compared which shows that copper interconnect reaches a higher temperature point due to selfheating as compared to Cu-MWCNT composite interconnect. Delay in Cu-MWCNT composite interconnect turned out to be lesser than copper interconnect. Also, increase in the fraction of MWCNT in Cu-MWCNT composite (FMW CNT ) leads to decrease in delay. Cu-MWCNT composite with higher FMW CNT experiences lesser Noise Delay Product (NDP) among all the alternatives which makes it most advantageous in terms of signal integrity. NDP of Cu-MWCNT composite interconnects are almost constant with increase in temperature making it immune to thermal effects. MWCNT has the highest reliability in terms of breakdown power (PBD) while 1 mm long Cu-MWCNT composite (with FMW CNT = 0.6) when compared to copper has 61% improvement in breakdown power. Cu-MWCNT composite interconnect is much better than copper interconnect specially for longer wire and higher FMW CNT in terms of NDP/PBD ratio. Our analysis recommends long Cu-MWCNT composite (with FMW CNT ∼ 0.6) interconnects to replace copper interconnects as a solution to increased self-heating in copper leading to its breakdown and also improvement in signal integrity aspects. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Copper-MWCNT composite: a solution to breakdown in copper interconnects | en_US |
dc.type | Article | en_US |
Appears in Collections: | Year-2021 |
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