Please use this identifier to cite or link to this item: http://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/3252
Full metadata record
DC FieldValueLanguage
dc.contributor.authorGuglani, S.-
dc.contributor.authorDimple, K. M.-
dc.contributor.authorKaushik, B. K.-
dc.contributor.authorRoy, S.-
dc.contributor.authorSharma, R.-
dc.date.accessioned2021-11-27T11:07:08Z-
dc.date.available2021-11-27T11:07:08Z-
dc.date.issued2021-11-27-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/3252-
dc.description.abstractIn this paper, a polynomial chaos (PC) approach based on the concept of multi-fidelity algorithms is presented for uncertainty quantification of multi-walled carbon nanotube (MWCNT) interconnect networks exhibiting imperfect contacts. The salient feature of the proposed approach is the development of a new low-fidelity model where each MWCNT conductor is represented as multiple parasitically coupled equivalent conductors depending on the nature of the contact resistance of each shell making up that conductor. This proposed low-fidelity model is provably more accurate than existing low-fidelity models, thereby leading to even faster construction of PC metamodels than previously possibleen_US
dc.language.isoen_USen_US
dc.subjectHigh-speed interconnectsen_US
dc.subjectmulti-fidelity algorithmsen_US
dc.subjectmulti-walled carbon nanotubesen_US
dc.subjectpolynomial chaosen_US
dc.subjectuncertainty quantificationen_US
dc.titleA Multi-Fidelity polynomial chaos approach for uncertainty quantification of MWCNT interconnect networks in the presence of imperfect contactsen_US
dc.typeArticleen_US
Appears in Collections:Year-2021

Files in This Item:
File Description SizeFormat 
Full Text.pdf1.4 MBAdobe PDFView/Open    Request a copy


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.