Please use this identifier to cite or link to this item: http://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/3942
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dc.contributor.authorGuo, F.-
dc.contributor.authorAygun, K.-
dc.contributor.authorDale Becker, W.-
dc.contributor.authorTalocia, S.G.-
dc.contributor.authorHejase, J.A.-
dc.contributor.authorWong, W.-W.-
dc.contributor.authorZhou, T.-
dc.contributor.authorBarnes, H.-
dc.contributor.authorPeng, Z.-
dc.contributor.authorPelger, A.-
dc.contributor.authorSahouli, M.-
dc.contributor.authorSchutt-Aine, J.-
dc.contributor.authorLing, F.-
dc.contributor.authorGriese, E.-
dc.contributor.authorPaladhi, P.R.-
dc.contributor.authorSharma, R.-
dc.contributor.authorPham, N.-
dc.contributor.authorWinkel, T.-M.-
dc.contributor.authorFledell, E.-
dc.contributor.authorHill, M.J.-
dc.contributor.authorSilva, B.-
dc.contributor.authorHu, K.-
dc.contributor.authorAronsson, J.-
dc.contributor.authorLiu, C.-
dc.contributor.authorJeong, Y.-
dc.contributor.authorYilmaz, A.E.-
dc.date.accessioned2022-09-03T06:22:19Z-
dc.date.available2022-09-03T06:22:19Z-
dc.date.issued2022-09-03-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/3942-
dc.description.abstractThe current state of the Packaging Benchmark Suite being developed by the IEEE EPS technical committee on electrical design, modeling, and simulation (TC-EDMS) is reviewed. The history and goals of the effort to establish the Suite, the key requirements from benchmarks that can support advances in simulation tools and computational methods, and the process being followed by the volunteer committee formed by the authors to produce the Suite are described. The first three benchmarks in the Suite and the steps that were taken to elevate them from potential candidates to effective benchmarks are presented.en_US
dc.language.isoen_USen_US
dc.subjectBenchmarkingen_US
dc.subjectComputer-aided designen_US
dc.subjectScientific methoden_US
dc.subjectTechnical collaborationen_US
dc.subjectValidationen_US
dc.subjectVerificationen_US
dc.titleThe IEEE EPS packaging benchmark suiteen_US
dc.typeArticleen_US
Appears in Collections:Year-2021

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