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dc.contributor.authorSingla, T.-
dc.contributor.authorPal Singh, A.-
dc.contributor.authorKumar, S.-
dc.contributor.authorSingh, G.-
dc.contributor.authorKumar, N.-
dc.date.accessioned2022-12-03T05:21:54Z-
dc.date.available2022-12-03T05:21:54Z-
dc.date.issued2022-12-03-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/4269-
dc.description.abstractThe usage of nano phase materials for strain sensing applications has attracted attention due to their unique electromechanical properties. The nanocomposite as piezo-resistive films provides an alternative for the realization of strain sensors with high sensitivity than the conventional sensors based on metal and semiconductor strain gauges. In this work, polymer based nano-composite with carbon nanotubes as filler were developed. The multi-walled carbon nanotubes/polystyrene (MWCNTs/PS) nano-composite films were prepared with different wt.% of CNTs using solution mixing method. Field emission scanning electron microscopy technique was carried out to investigate the morphology and dispersion of CNTs in the nano-composite sample. Fourier transform infrared spectroscopy technique was employed to characterize the bonds present in the prepared nano-composite. The electrical response of the composite films was recorded in the form of current-voltage (I-V) characteristics using source meter. The electromechanical response of the nano-composite films with different wt.% of filler CNTs was recorded by applying uni-axial tensile load. The electromechanical responses were then analyzed to obtain gauge factor for the strain sensitivity. The highest gauge factor of 133 was recorded during tensile testing of the nano-composite with 3 wt.% of CNTs fillers.en_US
dc.language.isoen_USen_US
dc.subjectCarbon nanotubesen_US
dc.subjectElectrical characterizationen_US
dc.subjectGauge factoren_US
dc.subjectNano-compositeen_US
dc.subjectPolystyreneen_US
dc.subjectStrain sensingen_US
dc.titleCharacterization of MWCNTs-polystyrene nanocomposite based strain sensoren_US
dc.typeArticleen_US
Appears in Collections:Year-2021

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