Please use this identifier to cite or link to this item: http://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/4486
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dc.contributor.authorVashist, V-
dc.contributor.authorKhokhar, M-
dc.contributor.authorInam, F A.-
dc.contributor.authorNair, R V.-
dc.date.accessioned2024-05-17T13:18:52Z-
dc.date.available2024-05-17T13:18:52Z-
dc.date.issued2024-05-17-
dc.identifier.urihttp://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/4486-
dc.description.abstractAbstract: Silicon carbide (SiC) hosts various color centers with emission lines from visible to near-infrared, with promising applications in quantum communication. Metasurfaces made using SiC can enhance the emission rate of inherent color centers to achieve on-demand single photon emission with a high emission rate. This is possible by engineering the amplitude and phase of the excited multipolar scattering moments in metasurfaces. The numerical simulations and analytical calculations are used to study the emission rate enhancement from an embedded single silicon vacancy ( ) center in SiC metasurface. The optimized metasurface balances multipolar moments at the zero-phonon line wavelength of 862 nm with 40 times field intensity confinement. The confinement provides substantial emission rate enhancement for the center, making it a bright single photon emitter at 862 nm. The significant emission enhancement offers new insights into the metasurface to achieve on-demand single-photon sources and efficient spin–photon interfaces.en_US
dc.language.isoen_USen_US
dc.subjectmetasurfacesen_US
dc.subjectquantum materialsen_US
dc.subjectquantum photonicsen_US
dc.subjectsilicon carbideen_US
dc.subject, silicon vacancy centersen_US
dc.subjectsingle photon emissionen_US
dc.titleEnhancing the Emission Rate of the Inherent Silicon-Vacancy Center Using Optimized Multipolar Moments in a Silicon Carbide Metasurfaceen_US
dc.typeArticleen_US
Appears in Collections:Year-2023

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