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dc.contributor.authorSinha, P.-
dc.date.accessioned2025-10-24T13:07:11Z-
dc.date.available2025-10-24T13:07:11Z-
dc.date.issued2025-04-17-
dc.identifier.urihttp://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/4946-
dc.description.abstractThe design of Last Level Caches (LLCs) using Static Random Access Memory (SRAM) is increasingly being challenged by emerging memory technologies like Non-Volatile Memories (NVM). Among these, Spin-Transfer Torque RAM (STT-RAM) stands out for its higher density and lower static power consumption. However, its drawbacks—higher write latency, increased write power, and limited write endurance—pose significant challenges. The primary issue preventing widespread adoption of STT-RAM in LLCs is the low write endurance, largely caused by the uneven distribution of write operations across the cache. Existing techniques to address this focus on minimizing either inter-set (InterV) or intra-set (IntraV) write variation to prolong the lifetime of STT-RAM-based LLCs. Additionally, STT-RAM’s high write latency can lead to congestion in the read-write queue of the LLC. To address these challenges, two techniques have been proposed to enhance endurance while maintaining performance. The first, PROLONG, is a dynamic write bypassing approach that redirects write-backs from the L2 cache to an SRAM buffer or main memory. This decision is guided by two parameters: the write hotness of the cache set and the liveness score of the incoming block. The second, LiveWay, dynamically bypasses writes based on their placement in write-hot ways and their liveness scores. Both methods significantly improve wear leveling, reducing InterV and IntraV by approximately 84% and 53%, respectively, while achieving a Relative Lifetime Improvement (RLI) of up to 22×. Additionally, by alleviating write congestion in the read-write queue, these techniques minimize system impact, ensuring smoother performance. Generic wear-leveling techniques primarily focus on extending LLC lifetime by reducing InterV and IntraV write variation, but block-level wear leveling remains rare. To address this gap, a decoupled cache architecture has been proposed. In this design, the Set-Associative SRAM tag array is separated from the Fully-Associative Data array, with the two linked via forward and backward pointers that maintain a 1:1 mapping. Two techniques are introduced within this architecture. The Primal Approach swaps writes between write-hot and write-cold blocks based on their write counts, with each block maintaining an individual write counter. The Hardware-Efficient Approach categorizes blocks into buckets using simple hashing. Writes from write-hot buckets are then redirected to write-cold buckets. These methods can achieve a RLI of up to 13.07×. Malicious attacks in a multi-core setup require access to just one core to repeatedly target specific memory locations, leading to accelerated lifetime degradation. To expose this vulnerability in STT-RAM-based LLCs, we propose four distinct attacks: Recurring Location Attack (RLA), Recurring Toggle Attack (RTA), Random Location Attack (RnLA), and Random Toggle Attack (RnTA). These Targeted Endurance Attacks illustrate the impact of malicious benchmarks on modern counter-based wear-leveling techniques and reveal how wear leveling influences the effectiveness of such attacks.en_US
dc.language.isoen_USen_US
dc.subjectSTT-RAMen_US
dc.subjectLast Level Cache (LLC)en_US
dc.subjectInterVen_US
dc.subjectIntraVen_US
dc.subjectWear levelingen_US
dc.subjectLifetime Improvementen_US
dc.subjectCache decouplingen_US
dc.subjectTargeted Endurance Attacken_US
dc.titleThe write problem: Challenges in implementation of STT-RAM based LLCsen_US
dc.typeThesisen_US
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