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Results 1-10 of 35 (Search time: 0.003 seconds).
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Issue DateTitleAuthor(s)
23-Nov-2016Analytical model for inverter design using floating gate graphene field effect transistorsNishad, A.K.; Dalakoti, A.; Jindal, A.; Kumar, R.; Kumar, S.; Sharma, R.
9-Oct-2018Effect of edge defects on band structure of zigzag graphene nanoribbonsWadhwa, P.; Kumar, S.; Kumar, T.J.D.; Shukla, A.; Kumar, R.
22-Aug-2019Defect induced magnetism in monolayer HfSe2: an ab initio studyYadav, A.; Kumar, S.; Muruganathan, M.; Kumar, R.
23-Aug-2019Evolution of collectivity and evidence of octupole correlations in 73BrBhattacharya, S.; Trivedi, T.; Negi, D.; Singh, R.P.; Muralithar, S.; Palit, R.; Ragnarsson, I.; Nag, S.; Rajbanshi, S.; Raju, M.K.; Parkar, V.V.; Mohanto, G.; Kumar, S.; Choudhury, D.; Kumar, R.; Bhowmik, R.K.; Pancholi, S.C.; Jain, A.K.
11-Dec-2019Observation of fission events in the 14N+181Ta system at projectile energies ≈ 5-6 MEV/ASharma, V.R.; Kumar, R.; Singh, B.P.; Aguilera, E.F.; Shuaib, M.; Mukherjee, S.; Dubey, R.; Singh, P.P.; Kumar, S.; Appannababu, S.; Yadav, A.; Sharma, M.K.; Morales-Rivera, J.C.; Prasad, R.
8-Jun-2021Thermoelectric properties of half heusler topological semi-metal liAuTeYadav, A.; Kumar, S.; Muruganathan, M.; Kumar, R.
16-Jun-2021Revised lifetime of the 11/2 − state in 45Sc via coulomb excitation∗Minda, M. M.; Napiorkowski, P. J.; Kumar, R.; Saxena, M.; Dutt, S; Agarwal, A.; Ahmed, I.; Bhattacharya, S.; Jhingan, A.; Kaur, J.; Habior, M. K.; Kumar, M.; Kumar, S.; Kumar, D.; Nanal, V.; Palit, R.; Rai, N. K.; Shuaib, M.; Sood, A.; Stolarz, A.; Trivedi, T.; Tyagi, A. K.; Bhowmik, R. K.; Wollersheim, H. J.
18-Jun-2021Temperature and dielectric surface roughness dependent performance analysis of cu-graphene hybrid interconnectsKumar, R.; Kumari, B.; Kumar, S.; Sahoo, M.; Sharma, R.
18-Jun-20212D- Discrete cosine transform based dynamically controllable image compression techniqueKumar, Y. S.; Kumar, R.; Kumar, S.
20-Jun-2021A temperature and dielectric roughness-aware matrix rational approximation model for the reliability assessment of Copper– Graphene hybrid On-Chip interconnectsKumar, R.; Kumar, A.; Guglani, S.; Kumar, S.; Roy, S.; Kaushik, B. K.; Sharma, R.; Achar, R.

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