Chittoriya, S.; Shivdeep; Jha, K.K.; Das, D.M.; Sharma, R.
(2022-12-20)
A PUF based hardware security circuit (PBHSC)
is proposed for testable ICs containing design for testability
(DFT) circuitry. DFT techniques such as scan chain enhance
the controllability and observability of internal ...