INSTITUTIONAL DIGITAL REPOSITORY

Browsing by Author "Dhillon, P.K."

Browsing by Author "Dhillon, P.K."

Sort by: Order: Results:

  • Dhillon, P.K.; Sarkar, S. (2017-03-10)
    Anisotropic etching using aqueous KOH was carried out on n-type Si (100) surfaces. Atomic force microscopy (AFM) was employed to study the etched surfaces for different times. The AFM data was investigated employing ...
  • Dhillon, P.K.; Sarkar, S. (2016-08-17)
    Isotropic etching using a mixture of HF, HNO3 and CH3COOH was carried out for single crystalline Si surfaces for different times and the resulting morphologies were investigated using atomic force microscopy. The acquired ...
  • Dhillon, P.K.; Sarkar, S.; Sarkar, A.; Moussa, A.; Vandervorst, W. (2016-05-25)
    Si(1 0 0) surface was physically eroded using 1 keV OView the MathML source ion beam and the resultant surface was studied by atomic force microscopy (AFM). The data were analyzed within the framework of dynamic scaling ...
  • Dhillon, P.K.; Brown, P.S.; Bain, C.D.; Badyal, J.P.S.; Sarkar, S. (2016-11-23)
    The morphology of hydrophobic CF4 plasma fluorinated polybutadiene surfaces has been characterised using atomic force microscopy (AFM). Judicious choice of the plasma power and exposure duration leads to formation of three ...