Thukral, K.; Vijayan, N.; Vij, M.; Nagaraja, C.M.; Jayaramakrishnan, V.; Jayalakshmy, M.S.; Kant, R.
(2017-05-23)
Today the fundamental aspect of the researchers is to explore maximum physical properties of the material for device fabrication. In the present article, single crystal X-ray diffraction has been carried out to verify the ...