Dimple, K M; Guglani, S; Dasgupta, A; Sharma, R; Roy, S; Kaushik, B K
(2024-07-02)
Abstract:
In this article, a modified knowledge-based artificial neural network (KBANN) metamodel is developed for the efficient uncertainty quantification of on-chip multiwalled carbon nanotube (MWCNT) interconnects. The ...