INSTITUTIONAL DIGITAL REPOSITORY

Browsing Year-2019 by Subject "Atomic force microscopy"

Browsing Year-2019 by Subject "Atomic force microscopy"

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  • Parida, B.K. (2019-12-31)
    Ion beam sputtering of a solid surface has the potential to create rich varieties of nanoscale periodic patterns by varying the beam parameters. This bottom-up approach of nanopatterning has been serving as an easy and ...

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