Kumar, R.; Kumar, A.; Guglani, S.; Kumar, S.; Roy, S.; Kaushik, B. K.; Sharma, R.; Achar, R.
(2021-06-20)
In this article, a closed-form matrix rational
approximation (MRA) model is presented for the reliability
assessment of copper–graphene hybrid on-chip interconnect networks. The key feature of this MRA model is its ...