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Temperature aware adaptations for improved read reliability in STT-MRAM memory subsystem
Sethuraman, S.
;
Tavva, V. K.
;
Rajamani, K.
;
Subramanian, C. K.
;
Kim, K. H.
;
Hunter, H. C.
;
Srinivas, M. B.
(
2021-06-19
)
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Author
Hunter, H. C. (1)
Kim, K. H. (1)
Rajamani, K. (1)
Sethuraman, S. (1)
Srinivas, M. B. (1)
Subramanian, C. K. (1)
Tavva, V. K. (1)
Subject
Memory power (1)
read bit-error rate (BER) (1)
read disturb BER (1)
read sense error (1)
reliability (1)
spin-transfer torque (1)
spin-transfer torque magneto-resistive random-access memory (STT-MRAM) (1)
temperature (1)
thermal stability (1)
... View More
Date Issued
2021 (1)