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Activity induced in different rare earth materials using heavy ion oxygen beam; thin layer activation analysis

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dc.contributor.author Savadi, V.V.
dc.contributor.author Singh, D.P.
dc.contributor.author Joshi, S.K.
dc.contributor.author Majeed, I.
dc.contributor.author Shuaib, Md.
dc.contributor.author Sharma, V.R.
dc.contributor.author Yadav, A.
dc.contributor.author Kumar, R.
dc.contributor.author Singh, P.P.
dc.contributor.author Unnati
dc.contributor.author Sharma, M.K.
dc.contributor.author Pandey, S.
dc.contributor.author Singh, B.P.
dc.contributor.author Prasad, R.
dc.date.accessioned 2020-12-15T05:43:20Z
dc.date.available 2020-12-15T05:43:20Z
dc.date.issued 2020-12-15
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/1641
dc.description.abstract Activities have been measured in spectroscopically pure rare earth materials viz; Terbium, Thulium and Tantalum, based on the remnant radioactivity induced in the material, when bombarded by 16O beam in the energy range from 70 MeV to 110 MeV. The cross sections of a number of isotopes populated through various reaction channels have been measured by the stacked foil activation technique. To measure the activity, yields of the radioactive isotopic products 172,171,170Ta, 171,170Hf, 171,170, 169Lu, 182,181Ir, 182,181Os, 181Re, 194,193,192Tl, 193, 192Hg, and 192,191,190Au have been determined using the measured cross-sections and subsequently used to measure the activity in these materials which has been found up to 8–16 μm. en_US
dc.language.iso en_US en_US
dc.subject Activation technique en_US
dc.subject Yield en_US
dc.subject Cross section measurements en_US
dc.subject Heavy ions en_US
dc.subject Thin layer activation technique en_US
dc.title Activity induced in different rare earth materials using heavy ion oxygen beam; thin layer activation analysis en_US
dc.type Article en_US


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