INSTITUTIONAL DIGITAL REPOSITORY

Estimation of endurance coefficient of insulating material under uniform and Non-Uniform fields by damage equalization method

Show simple item record

dc.contributor.author Thomas, A. J.
dc.contributor.author Reddy, C. C.
dc.date.accessioned 2021-06-20T06:00:03Z
dc.date.available 2021-06-20T06:00:03Z
dc.date.issued 2021-06-20
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/1863
dc.description.abstract In high voltage insulation system, the insulation will be undergoing various stresses and the life of the insulation will be different from uniform fields when stressed by a divergent field. In this paper, dc breakdown experiments at different step stresses are conducted using needle-plane and plane-plane electrode systems. Using the data from the breakdown tests, assessment of life of the insulating material can be done by estimating the voltage endurance coefficient (n) and accumulated damage. Stepped-stress damage equalization method (SSDEM) is used for estimating the life of the insulating material used. Interesting results on the role of uniform and non-uniform field on endurance coefficient is reported which in turn shows the effect of divergent and uniform stress on the life of the insulation. Furthermore, in this study, a numerical model is developed to estimate the electric field around the tip of the needle electrode using a semi-empirical equation of nonlinear conduction under steady state DC. Spherical geometry system is used for solving the differential equations numerically. The results show the developed numerical model can predict the Poisson’s field when conduction is field dependent. en_US
dc.language.iso en_US en_US
dc.subject step stress en_US
dc.subject damage equalization en_US
dc.subject dc breakdown en_US
dc.subject electrical treeing en_US
dc.subject endurance coefficient en_US
dc.subject needle-plane en_US
dc.subject spherical geometry en_US
dc.subject nonlinear conductivity en_US
dc.title Estimation of endurance coefficient of insulating material under uniform and Non-Uniform fields by damage equalization method en_US
dc.type Article en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Advanced Search

Browse

My Account