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Estimating per-unit-length resistance parameter in emerging Copper-Graphene hybrid interconnects via prior knowledge based accelerated neural networks

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dc.contributor.author Kumar, R.
dc.contributor.author Narayan, S. S. L.
dc.contributor.author Kumar, S.
dc.contributor.author Roy, S.
dc.contributor.author Kaushik, B. K.
dc.contributor.author Achar, R.
dc.contributor.author Sharma, R.
dc.date.accessioned 2021-06-20T07:21:46Z
dc.date.available 2021-06-20T07:21:46Z
dc.date.issued 2021-06-20
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/1871
dc.description.abstract In this paper, an artificial neural network (ANN) is developed to model how the geometrical parameters of hybrid copper-graphene interconnects affect the per-unit-length resistance values. The proposed ANN is intelligently trained using large amounts of data representing the prior knowledge about the interconnects, extracted from an analytical model and sparse amount of data extracted from a rigorous full-wave electromagnetic solver. In this way, the training of the ANN model is accelerated without significant loss in accuracy. en_US
dc.language.iso en_US en_US
dc.subject Artificial neural networks (ANN) en_US
dc.subject coppergraphene hybrid interconnects en_US
dc.subject per-unit-length resistance en_US
dc.subject variability analysis en_US
dc.subject training data en_US
dc.title Estimating per-unit-length resistance parameter in emerging Copper-Graphene hybrid interconnects via prior knowledge based accelerated neural networks en_US
dc.type Article en_US


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