dc.contributor.author | Sharma, S. | |
dc.contributor.author | Priya | |
dc.contributor.author | Saini, S. K. | |
dc.contributor.author | Nair, R. V. | |
dc.date.accessioned | 2021-08-25T23:21:19Z | |
dc.date.available | 2021-08-25T23:21:19Z | |
dc.date.issued | 2021-08-26 | |
dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/2502 | |
dc.description.abstract | The spatial- and spectral-dependent optical reflectivity measurements are essential to characterize various natural as well as artificial micron-scale photonic nanostructures. However, it is onerous to measure spatially and spectrally resolved reflectivity values from such photonic nanostructures due to their size limitations. Here, we discuss the development of a versatile microreflectivity setup with an in situ optical microscope combined with high-resolution actuators to measure the reflectivity from areas as small as 25 × 25 µm2 . We illustrate the reflectivity measurements from natural as well as artificially prepared ordered and disordered photonic nanostructures. The optical features that are hidden in the conventional reflectivity measurements are clearly resolved using the micro-reflectivity measurements. The proposed setup is also capable of measuring the polarizationdependent reflectivity and transmission of light | en_US |
dc.language.iso | en_US | en_US |
dc.title | A versatile micro-reflectivity setup for probing the optical properties of photonic nanostructures | en_US |
dc.type | Article | en_US |