Browsing Year-2012 by Author "Sarkar, S."

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Dual growth modes in ion bombarded Si surfaces

Dhillon, P. K.; Sarkar, S. (2021-10-27)

Morphological studies were done on Si (001) surfaces after rastering them with a 1 keV O2 + ion beam at an angle. The resulting mounded morphology was studied using atomic force microscopy (AFM) measurements. ...
Si nanoripples: A growth dynamical study

Dhillon, P.K.; Sarkar, S.; Sarkar, A.; Moussa, A.; Vandervorst, W. (2016-05-25)

Si(1 0 0) surface was physically eroded using 1 keV OView the MathML source ion beam and the resultant surface was studied by atomic force microscopy (AFM). The data were analyzed within the framework of dynamic scaling ...

Now showing items 1-2 of 2

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