INSTITUTIONAL DIGITAL REPOSITORY

The IEEE EPS packaging benchmark suite

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dc.contributor.author Guo, F.
dc.contributor.author Aygun, K.
dc.contributor.author Dale Becker, W.
dc.contributor.author Talocia, S.G.
dc.contributor.author Hejase, J.A.
dc.contributor.author Wong, W.-W.
dc.contributor.author Zhou, T.
dc.contributor.author Barnes, H.
dc.contributor.author Peng, Z.
dc.contributor.author Pelger, A.
dc.contributor.author Sahouli, M.
dc.contributor.author Schutt-Aine, J.
dc.contributor.author Ling, F.
dc.contributor.author Griese, E.
dc.contributor.author Paladhi, P.R.
dc.contributor.author Sharma, R.
dc.contributor.author Pham, N.
dc.contributor.author Winkel, T.-M.
dc.contributor.author Fledell, E.
dc.contributor.author Hill, M.J.
dc.contributor.author Silva, B.
dc.contributor.author Hu, K.
dc.contributor.author Aronsson, J.
dc.contributor.author Liu, C.
dc.contributor.author Jeong, Y.
dc.contributor.author Yilmaz, A.E.
dc.date.accessioned 2022-09-03T06:22:19Z
dc.date.available 2022-09-03T06:22:19Z
dc.date.issued 2022-09-03
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/3942
dc.description.abstract The current state of the Packaging Benchmark Suite being developed by the IEEE EPS technical committee on electrical design, modeling, and simulation (TC-EDMS) is reviewed. The history and goals of the effort to establish the Suite, the key requirements from benchmarks that can support advances in simulation tools and computational methods, and the process being followed by the volunteer committee formed by the authors to produce the Suite are described. The first three benchmarks in the Suite and the steps that were taken to elevate them from potential candidates to effective benchmarks are presented. en_US
dc.language.iso en_US en_US
dc.subject Benchmarking en_US
dc.subject Computer-aided design en_US
dc.subject Scientific method en_US
dc.subject Technical collaboration en_US
dc.subject Validation en_US
dc.subject Verification en_US
dc.title The IEEE EPS packaging benchmark suite en_US
dc.type Article en_US


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