Abstract:
Scanning electron microscopy (SEM), combined with energy-dispersive spectroscopy (EDS), is an extensively used technique
for in-depth microstructural analysis. Here, we present the EDS-Phase Segmentation (EDS-PhaSe) tool that enables phase
segmentation and phase analysis using the EDS elemental map images. It converts the EDS map images into estimated com
position maps for calculating markers of selective elemental redistribution in the scanned area and creates a phase-segmented
micrograph while providing approximate fraction and composition of each identified phase. EDS-PhaSe offers two unique
advantages. Firstly, it enables the direct processing of EDS elemental map images without requiring any raw or proprietary
data/software, thereby allowing the analysis of EDS results available in the published literature as images. Secondly, it ena
bles segmentation and analysis of phases even when the phase contrast is missing in backscattered micrographs, assisting in
correlating the XRD and SEM-EDS data as shown in this work for a AlCoCrFeNi high-entropy alloy.
