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Enhancing the Emission Rate of the Inherent Silicon-Vacancy Center Using Optimized Multipolar Moments in a Silicon Carbide Metasurface

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dc.contributor.author Vashist, V
dc.contributor.author Khokhar, M
dc.contributor.author Inam, F A.
dc.contributor.author Nair, R V.
dc.date.accessioned 2024-05-17T13:18:52Z
dc.date.available 2024-05-17T13:18:52Z
dc.date.issued 2024-05-17
dc.identifier.uri http://dspace.iitrpr.ac.in:8080/xmlui/handle/123456789/4486
dc.description.abstract Abstract: Silicon carbide (SiC) hosts various color centers with emission lines from visible to near-infrared, with promising applications in quantum communication. Metasurfaces made using SiC can enhance the emission rate of inherent color centers to achieve on-demand single photon emission with a high emission rate. This is possible by engineering the amplitude and phase of the excited multipolar scattering moments in metasurfaces. The numerical simulations and analytical calculations are used to study the emission rate enhancement from an embedded single silicon vacancy ( ) center in SiC metasurface. The optimized metasurface balances multipolar moments at the zero-phonon line wavelength of 862 nm with 40 times field intensity confinement. The confinement provides substantial emission rate enhancement for the center, making it a bright single photon emitter at 862 nm. The significant emission enhancement offers new insights into the metasurface to achieve on-demand single-photon sources and efficient spin–photon interfaces. en_US
dc.language.iso en_US en_US
dc.subject metasurfaces en_US
dc.subject quantum materials en_US
dc.subject quantum photonics en_US
dc.subject silicon carbide en_US
dc.subject , silicon vacancy centers en_US
dc.subject single photon emission en_US
dc.title Enhancing the Emission Rate of the Inherent Silicon-Vacancy Center Using Optimized Multipolar Moments in a Silicon Carbide Metasurface en_US
dc.type Article en_US


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