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Showing 10 out of a total of 10 results for collection: Year-2019.
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Multiphysics approach using computational fluid dynamics for signal integrity analysis in high speed serial links
Pathania, S.
;
Vasa, M.
;
Shrivastava, A.
;
Kumar, S.
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Kumar, V.
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Muthusamy, S.
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Seema, P.K.
;
Mutnury, B.
;
Sharma, R.
(
2021-08-12
)
Dual current based power discharge model for embedded USB Host-Devices system
Pandey, M. K.
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Goyal, M.
;
Sharma, P. K.
;
Sharma, R.
(
2021-08-12
)
Temperature-Aware Closed-Form matrix rational approximation model for crosstalk analysis of Multi-Walled carbon nanotube interconnects
Guglani, S.
;
Kumar, A.
;
Kumar, R.
;
Kaushik, B. K.
;
Sharma, R.
;
Achar, R.
;
Roy, S.
(
2021-08-12
)
Quality reliability assessment of USB-PLL clock failure in silicon products
Pandey, M. K.
;
Sinha, A. K.
;
Sharma, P. K.
;
Sharma, R.
(
2021-08-13
)
Bilayer graphene/HgCdTe based self-powered mid-wave IR nBn photodetector
Bansal, S.
;
Prakash, K.
;
Sharma, R.
;
Jain, P.
;
Gupta, N.
;
Singh, A. K.
;
Sardana, N.
;
Kumar, S.
(
2021-08-19
)
Thermal impact on high speed PCB interconnects
Pathania, S.
;
Vasa, M.
;
Mutnury, B.
;
Sharma, R.
(
2021-08-19
)
Colloidal synthesis of cobalt nanoparticles for application in non volatile memory device
Yadav, M.
;
Velampati, R. S. R.
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Sharma, R.
(
2021-08-27
)
Microwave aided synthesis of colloidal nickel nanocrystals for memory device application
Yadav, M.
;
Ravi Shankar, R. V.
;
Sharma, R.
(
2021-08-27
)
Investigating the role of interconnect surface roughness towards the design of poweraware network on chip
Kumar, S.
;
Sharma, R.
(
2021-09-01
)
Investigating the role of parasitic resistance in a class of nanoscale interconnects
Yousuf, S. Z.
;
Bhardwaj, A. K.
;
Sharma, R.
(
2021-12-01
)
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Author
Sharma, R. (10)
Kumar, S. (3)
Mutnury, B. (2)
Pandey, M. K. (2)
Pathania, S. (2)
Sharma, P. K. (2)
Vasa, M. (2)
Yadav, M. (2)
Achar, R. (1)
Bansal, S. (1)
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Subject
crosstalk (2)
Analog Validation (1)
Bilayer graphene (BLG) (1)
Carbon nanotubes (CNTs) (1)
CFD (1)
Chip-to-chip interconnects (1)
Co-analysis (1)
Deep sub-micron (DSM) regime (1)
Edge scattering (1)
Grain size (1)
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Date Issued
2021 (10)